Conference Description
The Transmission Electron Microscopy for Materials Research GRC is a premier, international scientific conference focused on advancing the frontiers of science through the presentation of cutting-edge and unpublished research, prioritizing time for discussion after each talk and fostering informal interactions among scientists of all career stages. The conference program includes an array of speakers and discussion leaders from institutions and organizations worldwide, concentrating on the latest developments in the field. The conference is five days long and held in a remote location to increase the sense of camaraderie and create scientific communities, with lasting collaborations and friendships. In addition to premier talks, the conference has designated time for poster sessions from individuals of all career stages, and afternoon free time and communal meals allow for informal networking opportunities with leaders in the field.
Recent breakthroughs in transmission electron microscopy (TEM) have pushed imaging and spectroscopy resolution to the vibrational limit, enabled sub-25 pm scale imaging, single-atom phonon mapping, and visualized spins and magnetic fields at unprecedented scales. However, as TEM approaches theoretical limits, the field faces critical challenges: imaging radiation-sensitive materials, achieving high-throughput imaging, and resolving atomic structures in micron-thick samples. This Gordon Research Conference will bring together experts to discuss the latest advances in TEM imaging, spectroscopy, and instrumentation, setting the agenda for the next decade of innovation in TEM characterization across both solid and soft matter.
The topics, speakers, and discussion leaders for the conference sessions are displayed below. The conference chair is currently developing their detailed program, which will include the complete meeting schedule, as well as the talk titles for all speakers. The detailed program will be available by October 18, 2025. Please check back for updates.
Aberration Correction, Sources, and Instrumentation
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Advances in 4D-STEM
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Electron Tomography
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Cryogenic and Low-Dose TEM
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Artificial Intelligence Methods
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Spectroscopy and Spectral Imaging
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Electron Detection
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Probing Interfaces and Functionalities
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In-Situ and Operando Microscopy
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