Conference Description
The Transmission Electron Microscopy for Materials Research GRC is a premier, international scientific conference focused on advancing the frontiers of science through the presentation of cutting-edge and unpublished research, prioritizing time for discussion after each talk and fostering informal interactions among scientists of all career stages. The conference program includes a diverse range of speakers and discussion leaders from institutions and organizations worldwide, concentrating on the latest developments in the field. The conference is five days long and held in a remote location to increase the sense of camaraderie and create scientific communities, with lasting collaborations and friendships. In addition to premier talks, the conference has designated time for poster sessions from individuals of all career stages, and afternoon free time and communal meals allow for informal networking opportunities with leaders in the field.
Recent breakthroughs in transmission electron microscopy (TEM) have pushed imaging and spectroscopy resolution to the vibrational limit, enabled sub-25 pm scale imaging, single-atom phonon mapping, and visualized spins and magnetic fields at unprecedented scales. However, as TEM approaches theoretical limits, the field faces critical challenges: imaging radiation-sensitive materials, achieving high-throughput imaging, and resolving atomic structures in micron-thick samples. This Gordon Research Conference will bring together experts to discuss the latest advances in TEM imaging, spectroscopy, and instrumentation, setting the agenda for the next decade of innovation in TEM characterization across both solid and soft matter.
The conference will consist of nine sessions, on the topics listed below. The conference chair is currently developing their preliminary program, which will include the names of the invited speakers and discussion leaders for each of these sessions. The preliminary program will be available by May 21, 2025. Please check back for updates.
